| 摘要 |
FIELD: electricity.SUBSTANCE: device to measure total resistance and noise parameters of a microwave dipole, comprising a meter of frequency characteristics and an integrated circuit within a central transmission line, a section of a transmission line connected to the central transmission line, electric switches - semiconductor instruments, controlled by DC voltages, the meter of frequency characteristics is connected with one end of the central transmission line, its other end - to the measured dipole. Where the meter of frequency characteristics is a meter of spectral density of noise capacity, the integrated circuit is made in the form of a monolithic integrated circuit on a semiconductor substrate, at the same time the section of the transmission line is made equal to one eighth of the wave length in the transmission line, electric switches are field transistors with Schottky barrier and at least in the form of one pair, at the same time in each specified pair the source of one field transistor with Schottky barrier is connected with the central line of transmission at the distance of one eighth of wavelength in the transmission line from the point of connection of the measured dipole and between its pairs, its drain with one end of the transmission line section, the other end of which is connected with the drain of the other field transistor with Schottky barrier, its drain is grounded, DC control voltages are supplied to gates of every field transistor with Schottky barrier from the appropriate source of DC control voltage.EFFECT: expansion of working frequency band, increased accuracy of measurement by reduced error of measurement and simplified device with preservation of automation capability.4 dwg |
