发明名称 METHOD FOR INSPECTING ELECTRO-OPTICAL DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for inspecting an electro-optical device, by which the product life of the device can be ensured in a highly accurate manner.SOLUTION: A method for inspecting an electro-optical device comprises: displaying an inspection image with an intermediate gradation on a display screen 200 by using a polarity inversion drive; measuring flicker values FLK of the inspection image at k number of measurement points (k is an integer of 2 or greater) of places on the display screen; calculating direct current component potentials Vfrom the flicker values FLK; and inspecting whether a first statistically processed result of the k number of the direct current component potentials Vsatisfies a first prescribed condition or not. In this way, a slight electrical asymmetry present in the electro-optical device is quantitatively evaluated. Accordingly, it is possible to provide an inspection method that is able to ensure the product life of the electro-optical device in a highly accurate manner.
申请公布号 JP2014048303(A) 申请公布日期 2014.03.17
申请号 JP20120188399 申请日期 2012.08.29
申请人 SEIKO EPSON CORP 发明人 NISHIDA MASAKAZU
分类号 G02F1/133;G02F1/13;G09F9/00 主分类号 G02F1/133
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