发明名称 High-K metal gate electrode structures formed at different process stages of a semiconductor device
摘要 Sophisticated high-k metal gate electrode structures are provided on the basis of a hybrid process strategy in which the work function of certain gate electrode structures is adjusted in an early manufacturing stage, while, in other gate electrode structures, the initial gate stack is used as a dummy material and is replaced in a very advanced manufacturing stage. In this manner, superior overall process robustness in combination with enhanced device performance may be achieved.
申请公布号 US8669151(B2) 申请公布日期 2014.03.11
申请号 US20100909291 申请日期 2010.10.21
申请人 HOENTSCHEL JAN;BEYER SVEN;SCHEIPER THILO;GRIEBENOW UWE;GLOBALFOUNDRIES INC. 发明人 HOENTSCHEL JAN;BEYER SVEN;SCHEIPER THILO;GRIEBENOW UWE
分类号 H01L21/8234 主分类号 H01L21/8234
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