SYSTEM AND METHOD FOR MEASURING DEFORMATION STRUCTURE

摘要

The present invention relates to a method for measuring the deflection of a structure, which comprises as follows: a process of photographing an object of an adjacent camera preferred in a specific direction from individual cameras installed at previously set intervals at individual fixed points of a structure by a previously set cycle; a process of measuring a reference point for the orientation of the obtained images from the photography of each camera; a process of calculating the interior orientation element and the relative orientation element of the image whose reference point is measured; a process of performing absolute orientation through the measured reference point, and calculating a three-dimensional coordinate by the object based on the calculated interior orientation element and the relative orientation element in order to measure the deflection of the point where each camera is installed; and a process of correcting the cumulative error of the measured deflection.