发明名称 THIN WAFER HANDLING AND KNOWN GOOD DIE TEST METHOD
摘要 A method of attaching a microelectronic element to a substrate can include aligning the substrate with a microelectronic element, the microelectronic element having a plurality of spaced-apart electrically conductive bumps each including a bond metal, and reflowing the bumps. The bumps can be exposed at a front surface of the microelectronic element. The substrate can have a plurality of spaced-apart recesses extending from a first surface thereof. The recesses can each have at least a portion of one or more inner surfaces that are non-wettable by the bond metal of which the bumps are formed. The reflowing of the bumps can be performed so that at least some of the bond metal of each bump liquefies and flows at least partially into one of the recesses and solidifies therein such that the reflowed bond material in at least some of the recesses mechanically engages the substrate.
申请公布号 US2014054763(A1) 申请公布日期 2014.02.27
申请号 US201213593118 申请日期 2012.08.23
申请人 WOYCHIK CHARLES G.;YANG SE YOUNG;MONADGEMI PEZHMAN;CASKEY TERRENCE;UZOH CYPRIAN EMEKA;INVENSAS CORPORATION 发明人 WOYCHIK CHARLES G.;YANG SE YOUNG;MONADGEMI PEZHMAN;CASKEY TERRENCE;UZOH CYPRIAN EMEKA
分类号 H01L23/00;H01L23/498 主分类号 H01L23/00
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