CUT OBJECT INSPECTION DEVICE, CUT OBJECT INSPECTION METHOD, PROGRAM FOR CUT OBJECT INSPECTION DEVICE, AND CUT OBJECT INSPECTION SYSTEM

摘要

PROBLEM TO BE SOLVED: To provide a cut object inspection device and the like capable of inspecting a part left uncut of a cut object.SOLUTION: In a cut object inspection device which inspects a cut object, image data of the cut object imaged after cutting are acquired (S12, S13), reference data to be compared with the acquired image data are acquired (S14), and the acquired image and reference data are compared, so that it is determined whether or not a part left uncut of the cut object is present (S15).