发明名称 PLASMA PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To prevent a rise of plasma potential occurring due to insufficient DC ground, and to prevent occurrence of abnormal discharge in a plasma etching processing apparatus.SOLUTION: A plasma processing apparatus comprises: a vacuum container where plasma is generated inside; a base flange constituting a lower part of the vacuum container and grounded; a lower electrode arranged in the vacuum container and on which a sample to be worked is placed; a vertical drive mechanism vertically driving the lower electrode; a cylindrical first cover fixed to a ground potential part included in the lower electrode and for shielding the vertical drive mechanism from the plasma; and a cylindrical second cover fixed to the base flange and for shielding the vertical drive mechanism from the plasma. In the plasma processing apparatus performing surface processing on the sample to be worked with the plasma, the cylindrical second cover is made of conductor material.
申请公布号 JP2014033225(A) 申请公布日期 2014.02.20
申请号 JP20130218795 申请日期 2013.10.22
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 ADACHI JUNJI;MATSUMOTO TAKESHI;MIYAJI MASAKAZU;HIRATA AKIRA;YAGI KATSUJI
分类号 H01L21/3065;H05H1/46 主分类号 H01L21/3065
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