发明名称 Domain wall assisted spin torque transfer magnetresistive random access memory structure
摘要 A semiconductor memory device includes a first ferromagnetic layer magnetically pinned and positioned within a first region of a substrate; a second ferromagnetic layer approximate the first ferromagnetic layer; and a barrier layer interposed between the first ferromagnetic layer and the first portion of the second ferromagnetic layer. The second ferromagnetic layer includes a first portion being magnetically free and positioned within the first region; a second portion magnetically pinned to a first direction and positioned within a second region of the substrate, the second region contacting the first region from a first side; and a third portion magnetically pinned to a second direction and positioned within a third region of the substrate, the third region contacting the first region from a second side.
申请公布号 US8648401(B2) 申请公布日期 2014.02.11
申请号 US20100884351 申请日期 2010.09.17
申请人 LAI CHIH-HUANG;HUANG SHENG-HUANG;HUANG KUO-FENG;LIU MING-TE;LIN CHUN-JUNG;KAO YA-CHEN;CHEN WEN-CHENG;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LAI CHIH-HUANG;HUANG SHENG-HUANG;HUANG KUO-FENG;LIU MING-TE;LIN CHUN-JUNG;KAO YA-CHEN;CHEN WEN-CHENG
分类号 H01L21/02 主分类号 H01L21/02
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