发明名称 OPTICAL CHARACTERISTIC MEASURING APPARATUS
摘要 An optical characteristics measuring apparatus of the present invention includes a hemispherical part having a reflective surface in an inner wall, and a plane part which is arranged to close the aperture of the hemispherical part and has a reflective surface in an inner wall side of the hemispherical part. The plane part includes a first window to install a light source in the range including actual curvature center of the hemispherical part. At least one of the hemispherical parts and the plane part includes a plurality of second windows which extract a light from the inside of the hemispherical part arranged with fixed regularity.
申请公布号 KR20140011907(A) 申请公布日期 2014.01.29
申请号 KR20120151692 申请日期 2012.12.24
申请人 OTSUKA ELECTRONICS CO., LTD. 发明人 OHKUBO KAZUAKI;SHIRAIWA HISASHI
分类号 G01J1/02;G01J1/08 主分类号 G01J1/02
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