发明名称 |
OPTICAL CHARACTERISTIC MEASURING APPARATUS |
摘要 |
An optical characteristics measuring apparatus of the present invention includes a hemispherical part having a reflective surface in an inner wall, and a plane part which is arranged to close the aperture of the hemispherical part and has a reflective surface in an inner wall side of the hemispherical part. The plane part includes a first window to install a light source in the range including actual curvature center of the hemispherical part. At least one of the hemispherical parts and the plane part includes a plurality of second windows which extract a light from the inside of the hemispherical part arranged with fixed regularity. |
申请公布号 |
KR20140011907(A) |
申请公布日期 |
2014.01.29 |
申请号 |
KR20120151692 |
申请日期 |
2012.12.24 |
申请人 |
OTSUKA ELECTRONICS CO., LTD. |
发明人 |
OHKUBO KAZUAKI;SHIRAIWA HISASHI |
分类号 |
G01J1/02;G01J1/08 |
主分类号 |
G01J1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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