发明名称 CONTROL ELEMENT AND CHARGED PARTICLE BEAM DEVICE USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a control element which responds to a request for enhancing the irradiation accuracy of a charged particle beam to an object, and to provide a charged particle beam device using the same.SOLUTION: Control elements 6a-6c include, respectively, a cylinder 7 composed of ceramic in which a through hole P for passing a charged particle beam is formed, and an electrode 8 bonded to the inner peripheral surface S1 of the through hole P in the cylinder 7. The electrode 8 has a palladium film bonded to the inner peripheral surface S1 of the cylinder 7, and a rhodium film bonded to the inner peripheral surface S1 of the cylinder 7 with the palladium film interposed therebetween. Bond strength of the cylinder 7 and the electrode 8 can be enhanced, and control of the charged particle beam by the electrode 8 can be stabilized.
申请公布号 JP2014007045(A) 申请公布日期 2014.01.16
申请号 JP20120141627 申请日期 2012.06.25
申请人 KYOCERA CORP 发明人 KOYAMA TATSUO
分类号 H01J37/147 主分类号 H01J37/147
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