发明名称 3D integrated circuit device fabrication with precisely controllable substrate removal
摘要 A method is provided for fabricating a 3D integrated circuit structure. According to the method, a first active circuitry layer wafer is provided. The first active circuitry layer wafer comprises a P+ portion covered by a P- layer, and the P- layer includes active circuitry. The first active circuitry layer wafer is bonded face down to an interface wafer that includes a first wiring layer, and then the P+ portion of the first active circuitry layer wafer is selectively removed with respect to the P- layer of the first active circuitry layer wafer. Next, a wiring layer is fabricated on the backside of the P- layer. Also provided are a tangible computer readable medium encoded with a program for fabricating a 3D integrated circuit structure, and a 3D integrated circuit structure.
申请公布号 US8629553(B2) 申请公布日期 2014.01.14
申请号 US201213398505 申请日期 2012.02.16
申请人 FAROOQ MUKTA G.;HANNON ROBERT;IYER SUBRAMANIAN S.;KOESTER STEVEN J.;PURUSHOTHAMAN SAMPATH;YU ROY R.;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 FAROOQ MUKTA G.;HANNON ROBERT;IYER SUBRAMANIAN S.;KOESTER STEVEN J.;PURUSHOTHAMAN SAMPATH;YU ROY R.
分类号 H01L23/34;H01L21/30 主分类号 H01L23/34
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