发明名称 WAFER MANUFACTURING CLEANING APPARATUS, PROCESS AND METHOD OF USE
摘要 A cleaning wafer or substrate for use in cleaning, or in combination with, components of, for example, integrated chip manufacturing apparatus. The cleaning substrate can include a substrate having varying predetermined surface features, such as one or more predetermined adhesive, non-tacky, electrostatic, projection, depression, or other physical sections. The predetermined features can provide for more effective cleaning of the components with which they are used, such as an integrated chip manufacturing apparatus in the place of the integrated chip wafer. The cleaning substrate can be urged into cleaning or other position by vacuum, mechanical, electrostatic, or other forces. The cleaning substrate can adapted to accomplish a variety of functions, including abrading or polishing. The cleaning substrate may be made by a novel method of making, and it may then be used in a novel method of use I combination with chip manufacturing apparatus.
申请公布号 US2013333128(A1) 申请公布日期 2013.12.19
申请号 US201313971619 申请日期 2013.08.20
申请人 INTERNATIONAL TEST SOLUTIONS, INC. 发明人 HUMPHREY ALAN E.;DUVALL JAMES H.;BROZ JERRY
分类号 H01L21/67 主分类号 H01L21/67
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