发明名称 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, AND RESIST FILM, PATTERN FORMATION METHOD, ELECTRONIC DEVICE MANUFACTURING METHOD AND ELECTRONIC DEVICE USING SAID COMPOSITION
摘要 PROBLEM TO BE SOLVED: To provide: an actinic ray-sensitive or radiation-sensitive resin composition which allows formation of patterns with few blob defects and has excellent temporal stability as a liquid resist; and a resist film, a pattern formation method, an electronic device manufacturing method and an electronic device using the composition.SOLUTION: The actinic ray-sensitive or radiation-sensitive resin composition contains (A) a resin whose solubility in an alkaline developer increases by the action of an acid, (B) a compound which generates an acid upon exposure to an actinic ray or radiation, (C) a compound with groups located on nitrogen atoms and leaving by the action of an acid, and (D) a resin having a partial structure represented by general formula (A). In the general formula (A), Rrepresents a fluorine atom-substituted hydrocarbon group.
申请公布号 JP2013250329(A) 申请公布日期 2013.12.12
申请号 JP20120123473 申请日期 2012.05.30
申请人 FUJIFILM CORP 发明人 IWATO KAORU
分类号 G03F7/039;C08F20/26;G03F7/004;G03F7/38;H01L21/027 主分类号 G03F7/039
代理机构 代理人
主权项
地址