发明名称 FAULT DETECTION CIRCUIT, ELECTRONIC EQUIPMENT AND FAULT DETECTION METHOD
摘要 A fault detection circuit includes: a switching element, disposed between a first node and a second node, configured to perform a switching operation in accordance with a control signal; and a detection circuit configured to detect a temporal voltage change at the second node according to the switching operation of the switching element.
申请公布号 US2013321967(A1) 申请公布日期 2013.12.05
申请号 US201313771206 申请日期 2013.02.20
申请人 FUJITSU LIMITED 发明人 MUNEYASU KAZUKI;EDA SUSUMU
分类号 H02H3/00 主分类号 H02H3/00
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