发明名称 Deposition method
摘要 A deposition method capable of forming an oxide film with a predetermined film thickness ratio using a deposition gas with which a small film thickness ratio is obtained and a deposition gas with which a large film thickness ratio is obtained. When forming an oxide film having a larger film thickness on the surface of a substrate than on the bottom surface of the hole so that the film thickness ratio of the oxide film formed on the surface of the substrate to the oxide film formed on the bottom surface of the hole becomes a predetermined ratio, plasma is generated from a gas mixture including tetraethoxysilane and oxygen to form an oxide film and then plasma is generated from a gas mixture including silane and nitrous oxide.
申请公布号 US8598049(B2) 申请公布日期 2013.12.03
申请号 US201013517193 申请日期 2010.11.25
申请人 HATASHITA MASAYASU;OISHI AKIMITSU;MURAKAMI SHOICHI;SECUREVIEW LLC 发明人 HATASHITA MASAYASU;OISHI AKIMITSU;MURAKAMI SHOICHI
分类号 H01L21/762;H01L21/768 主分类号 H01L21/762
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