发明名称 SIGNAL PROCESSING CIRCUIT AND TEST APPARATUS USING THE SAME
摘要 PROBLEM TO BE SOLVED: To execute a memory check with a small load on an embedded CPU.SOLUTION: A memory controller 6 is connected to a memory 8, and does not have an ECC (Error Check and Correct) function. An embedded CPU 4 is accessibly connected to the memory via the memory controller 6. A memory check circuit 10 is accessibly connected to the memory via the memory controller 6, and accesses the memory 8 in a non-operation period of the embedded CPU 4 to check data stored in the memory 8.
申请公布号 JP2013238926(A) 申请公布日期 2013.11.28
申请号 JP20120109897 申请日期 2012.05.11
申请人 ADVANTEST CORP 发明人 SAKAMOTO MITSUSUKE
分类号 G06F11/22;G06F12/16 主分类号 G06F11/22
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