发明名称 |
DIGITAL SIGNAL GENERATOR AND AUTOMATIC TEST EQUIPMENT HAVING THE SAME |
摘要 |
The present invention provides a digital signal generator generating a high-speed data signal having a variable cycle what a user wants by using a commercial IC and automatic test equipment (ATE) having the same. The digital signal generator comprises an input unit receiving signal information of a target data signal, a controller calculating at least two delay values and at least two data values, the at least two delay values and the at least two data values being used to generate a data signal corresponding to the signal information input through the input unit, a multi-phase clock generator delaying a reference clock signal based on the at least two delay values to generate at least two clock signals having different phases, a signal generator generating at least two data signals by assigning the at least two data values to the at least two clock signals, and a logic gate unit outputting the data signal corresponding to the signal information input through the input unit based on the at least two data signals generated in the signal generator and including at least one XOR gate. [Reference numerals] (110) Input unit;(120) Control unit;(130) Multi-phase clock generator;(140) Signal generation unit;(150) Logic gate unit |
申请公布号 |
KR20130126435(A) |
申请公布日期 |
2013.11.20 |
申请号 |
KR20120118280 |
申请日期 |
2012.10.24 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD.;GEORGIA TECH RESEARCH CORPORATION |
发明人 |
LEE, SEONG KWAN;CHOI, HYUN WOO;KIM, SUNG YEOL;DAVID.C. KEEZER;CARL E. GRAY;TE HUICHEN |
分类号 |
G01R31/3183 |
主分类号 |
G01R31/3183 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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