发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a technique capable of reducing a difference in linear expansion coefficient between a heat sink and a semiconductor device.SOLUTION: The semiconductor device 1 includes a first heat sink 11 and an IGBT 13 and a reflux diode 14 formed above the first heat sink 11. The first heat sink 11 is composed of alloy whose major component is AlSiC, Cu-CuMo-Cu and Mo, or Fe or alloy whose major component is Fe, or W or alloy whose major component is W. The IGBT 13 and the reflux diode 14 include Si.
申请公布号 JP2013225556(A) 申请公布日期 2013.10.31
申请号 JP20120096393 申请日期 2012.04.20
申请人 MITSUBISHI ELECTRIC CORP 发明人 INOKUCHI SEIICHIRO;FUJITA AKIRA
分类号 H01L23/373;H01L23/34;H01L25/07;H01L25/18 主分类号 H01L23/373
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