发明名称 |
PLASMA NITRIDING TREATMENT METHOD AND PROCESS OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a plasma nitriding treatment method capable of directly nitriding silicon using plasma to form a high quality thin silicon nitride film.SOLUTION: A nitriding treatment is performed at a temperature of 500°C or over, preferably between 600 to 800°C when a nitriding treatment is performed by an action of microwave excitation high density plasma formed by introducing a micro wave into a processing chamber with a planar antenna having a plurality of slots for silicon of a surface of an object to be treated in the processing chamber of the plasma processing apparatus. |
申请公布号 |
JP2013225682(A) |
申请公布日期 |
2013.10.31 |
申请号 |
JP20130118637 |
申请日期 |
2013.06.05 |
申请人 |
TOHOKU UNIV |
发明人 |
OMI TADAHIRO;TERAMOTO AKINOBU;HONDA MINORU;NAKANISHI TOSHIO |
分类号 |
H01L21/318;H01L21/31;H01L21/336;H01L29/78;H01L29/786 |
主分类号 |
H01L21/318 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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