发明名称 PLASMA NITRIDING TREATMENT METHOD AND PROCESS OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a plasma nitriding treatment method capable of directly nitriding silicon using plasma to form a high quality thin silicon nitride film.SOLUTION: A nitriding treatment is performed at a temperature of 500°C or over, preferably between 600 to 800°C when a nitriding treatment is performed by an action of microwave excitation high density plasma formed by introducing a micro wave into a processing chamber with a planar antenna having a plurality of slots for silicon of a surface of an object to be treated in the processing chamber of the plasma processing apparatus.
申请公布号 JP2013225682(A) 申请公布日期 2013.10.31
申请号 JP20130118637 申请日期 2013.06.05
申请人 TOHOKU UNIV 发明人 OMI TADAHIRO;TERAMOTO AKINOBU;HONDA MINORU;NAKANISHI TOSHIO
分类号 H01L21/318;H01L21/31;H01L21/336;H01L29/78;H01L29/786 主分类号 H01L21/318
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