发明名称 PZT-BASED FERROELECTRIC THIN FILM AND METHOD OF MANUFACTURING THE SAME
摘要 <p>PURPOSE: A ferroelectric PZT thin film maintains dielectric performance similar to a conventional ferroelectric PZT thin film and has improved lifetime reliability. CONSTITUTION: A ferroelectric PZT thin film is formed on the lower electrode (11) of a substrate (10) which has the lower electrode on which a crystal plane is aligned in an axial direction. The ferroelectric thin film has an orientation control layer (12) which is formed on the lower electrode and has a crystal orientation-controlled layer with a thickness of 45-270 nm; a film thickness-controlling layer (13) which is formed on the crystal orientation-controlled layer and has the same crystal orientation as the crystal orientation of the orientation-controlled layer; and an interface (14) between the orientation-controlled layer and a film thickness-controlling layer. [Reference numerals] (10) Substrate; (11) Lower electrode; (12) Orientation control layer; (13) Film thickness-controlling layer; (14) Interface</p>
申请公布号 KR20130111305(A) 申请公布日期 2013.10.10
申请号 KR20130028154 申请日期 2013.03.15
申请人 MITSUBISHI MATERIALS CORP. 发明人 NOGUCHI TAKASHI;DOI TOSHIHIRO;SAKURAI HIDEAKI;WATANABE TOSHIAKI;SOYAMA NOBUYUKI
分类号 H01B3/10;C04B35/49;H01B17/62;H01G4/10 主分类号 H01B3/10
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