| 摘要 |
Disclosed is an eddy current non-destructive inspection device which includes an eddy current probe with a probe conductor resistance dynamically changing due to operation conditions, such as temperature. The device further includes a signal generating circuit generating an inspection frequency signal and a low frequency signal. Sensed inspection frequency signals are processed to produce resulting signals with possible drift. A low frequency processing circuit includes a resistance calculator producing a substantially true value of the dynamic probe resistance, based on which compensation operations are configured to correct the drifted resulting signals and produce corrected resulting signals.
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