发明名称 SELF-FORMING, SELF-ALIGNED BARRIERS FOR BACK-END INTERCONNECTS AND METHODS OF MAKING SAME
摘要 Processes of forming an insulated wire into an interlayer dielectric layer (ILD) of a back-end metallization includes thermally treating a metallic barrier precursor under conditions to cause at least one alloying element in the barrier precursor to form a dielectric barrier between the wire and the ILD. The dielectric barrier is therefore a self-forming, self-aligned barrier. Thermal processing is done under conditions to cause the at least one alloying element to migrate from a zone of higher concentration thereof to a zone of lower concentration thereof to further form the dielectric barrier. Various apparatus are made by the process.
申请公布号 US2013260553(A1) 申请公布日期 2013.10.03
申请号 US201313893143 申请日期 2013.05.13
申请人 YOO HUI JAE;BIELEFELD JEFFREY D.;KING SEAN W.;BALAKRISHNAN SRIDHAR 发明人 YOO HUI JAE;BIELEFELD JEFFREY D.;KING SEAN W.;BALAKRISHNAN SRIDHAR
分类号 H01L21/768 主分类号 H01L21/768
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