发明名称 MEMORY WITH ISOLATION STRUCTURE
摘要 A recessed transistor construction is formed between a first access transistor construction and a second access transistor construction to provide isolation between the access transistor constructions of a memory device. In some embodiments, a gate of the recessed transistor construction is grounded. In an embodiment, the access transistor constructions are recess access transistors. In an embodiment, the memory device is a DRAM. In another embodiment, the memory device is a 4.5F2 DRAM cell.
申请公布号 US2013248958(A1) 申请公布日期 2013.09.26
申请号 US201313799084 申请日期 2013.03.13
申请人 MICRON TECHNOLOGY, INC. 发明人 JUENGLING WERNER
分类号 H01L27/108 主分类号 H01L27/108
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