MEASUREMENT OF RADIATIONS OF HIGH FLUENCE BY A CAPACITIVE ELEMENT OF MOS TYPE
摘要
<p>A method of measuring a dose related to the non-ionizing effects of a radiation of particles comprises the irradiation of a capacitive element furnished with an electrode made of a semiconducting material, the measurement of the capacitance of the capacitive element in an accumulation regime and the determination of the dose related to the non-ionizing effects on the basis of the measurement of capacitance of the capacitive element in the accumulation regime.</p>
