发明名称 |
Neutron porosity measurement devices with semiconductor neutron detection cells and methods |
摘要 |
A neutron porosity measurement device includes a neutron source configured to emit neutrons having a first energy and a segmented semiconductor detector located at a predetermined distance from the neutron source. The segmented semiconductor detector includes a plurality of semiconductor neutron detection cells configured to detect neutrons having a second energy smaller than the first energy. The cells are arranged in coplanar subsets between a first distance and a second distance from the neutron source. One or more of the neutron detection cells are configured to acquire data related to detected neutrons independently from one or more other of the neutron detected cells. A method of manufacturing the neutron porosity measurement device is also provided. |
申请公布号 |
EP2551702(A3) |
申请公布日期 |
2013.09.18 |
申请号 |
EP20120177686 |
申请日期 |
2012.07.24 |
申请人 |
SONDEX WIRELINE LIMITED |
发明人 |
CLIMENT, HELENE CLAIRE;MACINNIS, JASON |
分类号 |
G01V5/10;G01T3/08 |
主分类号 |
G01V5/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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