发明名称 SOI wafer, method for producing same, and method for manufacturing semiconductor device
摘要 An SOI wafer including: a supporting substrate 1; a BOX layer 2 provided above the supporting substrate 1, the BOX layer 2 being formed by a thermal oxidization; a gettering layer 3 provided immediately on the BOX layer 2 and mainly composed of a silicon which contains one or more of oxygen, carbon and nitrogen and contains at least oxygen; and an S layer 4 in which semiconductor devices are to be formed, the S layer 4 being mainly composed of a monocrystalline silicon.
申请公布号 US8531000(B2) 申请公布日期 2013.09.10
申请号 US201113214007 申请日期 2011.08.19
申请人 YONEDA KENJI;PANASONIC CORPORATION 发明人 YONEDA KENJI
分类号 H01L29/00;H01L27/01;H01L27/12;H01L31/0392 主分类号 H01L29/00
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