Memory system transfers error address detected by test apparatus to memory device, and stores detected error address in non volatile memory device

摘要

The memory system has a memory device (200) with a non volatile memory device that is provided with a matrix array structure. A test apparatus (100) e.g. semiconductor chip is provided for testing the memory device. An error address detected by the test apparatus is transferred to the memory device, and is stored in the non volatile memory device. An error address memory is controlled by a control unit. Independent claims are included for the following: (1) a method for operating test apparatus; and (2) a method for operating memory device.