发明名称 Method of Manufacturing a Semiconductor Device
摘要 Semiconductor devices include a semiconductor substrate with a stack structure protruding from the semiconductor substrate and surrounded by an isolation structure. The stack structure includes an active layer pattern and a gap-filling insulation layer between the semiconductor substrate and the active layer pattern. A gate electrode extends from the isolation structure around the stack structure. The gate electrode is configured to provide a support structure for the active layer pattern. The gate electrode may be a gate electrode of a silicon on insulator (SOI) device formed on the semiconductor wafer and the semiconductor device may further include a bulk silicon device formed on the semiconductor substrate in a region of the semiconductor substrate not including the gap-filing insulation layer.
申请公布号 US2013224925(A1) 申请公布日期 2013.08.29
申请号 US201313854322 申请日期 2013.04.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 OH CHANG-WOO;PARK DONG-GUN;KIM DONG-WON;LI MING;KIM SUNG-HWAN
分类号 H01L29/66;H01L21/762 主分类号 H01L29/66
代理机构 代理人
主权项
地址