| 摘要 |
A method, system, and apparatus for non-destructively characterizing one or more regions within an ultra-hard polycrystalline structure using eddy current measurements. The apparatus includes an eddy current measuring device having at least one terminal, a leached component comprising a polycrystalline structure, a first wire, and a probe. The leached component includes a cutting surface and an opposing second surface. A portion of the polycrystalline structure extending inwardly from the cutting surface has at least a portion of a catalyst material removed from therein. The first wire electrically couples the terminal to the probe, which is placed in contact with the cutting surface. The eddy current is measured one or more times and compared to a calibration curve to determine an estimated leaching depth within the polycrystalline structure. A data scattering range is ascertained to determine a relative porosity of the polycrystalline structure or the leaching quality within the polycrystalline structure. |
