| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for easily changing SPR measurement chips by optimizing the shape of a refractive index matching sheet integrally formed with a transparent substrate or by optimizing the shape of the transparent substrate to solve existing problems in an SPR optical system wherein air bubbles liable to get in the transparent substrate make measurement difficult when sticking it fast to the matching sheet, the transparent substrate is not stabilized when sticking it fast thereto, and the like. SOLUTION: This chip for SPR measurement is used in an SPR optical system 210. This chip includes a transparent substrate 205 comprising a metallic thin film for SPR measurement, and further, a transparent elastic adhesive sheet 206 on a surface of the transparent substrate 205 on the opposite side of the thin film. The adhesive sheet 206 has a liquid drop shape swelling from the end of the sheet toward the middle. COPYRIGHT: (C)2010,JPO&INPIT |
