发明名称 |
CHECKING THE STOICHIOMETRY OF I-III-VI LAYERS FOR USE IN PHOTOVOLTAIC USING IMPROVED ELECTROLYSIS CONDITIONS |
摘要 |
The invention relates to manufacturing a I-III-VI compound in the form of a thin film for use in photovoltaics, including the steps of: a) electrodepositing a thin-film structure, consisting of I and/or III elements, onto the surface of an electrode that forms a substrate (SUB); and b) incorporating at least one VI element into the structure so as to obtain the I-III-VI compound. According to the invention, the electrodeposition step comprises checking that the uniformity of the thickness of the thin film varies by no more than 3% over the entire surface of the substrate receiving the deposition.
|
申请公布号 |
US2013206233(A1) |
申请公布日期 |
2013.08.15 |
申请号 |
US201113879703 |
申请日期 |
2011.10.10 |
申请人 |
GRAND PIERRE-PHILIPPE;JAIME SALVADOR;DE GASQUET PHILIPPE;DELIGIANNI HARIKLIA;ROMANKIW LUBOMYR T.;VAIDYANTAHAN RAMAN;HUANG QIANG;AHMED SHAFAAT;NECIS |
发明人 |
GRAND PIERRE-PHILIPPE;JAIME SALVADOR;DE GASQUET PHILIPPE;DELIGIANNI HARIKLIA;ROMANKIW LUBOMYR T.;VAIDYANTAHAN RAMAN;HUANG QIANG;AHMED SHAFAAT |
分类号 |
H01L31/0264;H01L21/02 |
主分类号 |
H01L31/0264 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|