发明名称 |
BIT INSPECTION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a bit inspection method capable of easily moving an ultrasonic probe and performing flaw detection with equivalent precision over the whole flaw detection surface.SOLUTION: A bit inspection method comprises: a shape measurement step of measuring a thickness dimension of a carbide tip 10 with its front surface 11 and back surface 12 being non-parallel to each other; a reference thickness dimension determination step of determining an average value of thickness dimensions as a reference thickness dimension; a correction coefficient calculation step of calculating a correction coefficient of an echo value from a difference between a thickness dimension at a measurement point P and the reference thickness dimension; an ultrasonic flaw insepction step of performing an ultrasonic flaw inspection of a brazed surface 3, by setting the brazed surface 3 corresponding to a position having the reference thickness dimension to match a focal distance of an ultrasonic probe 2 and moving the ultrasonic probe 2 along the front surface 11 of the carbide tip 10; a correction step of calculating a corrected echo value by multiplying a measured echo value at each measurement point P obtained in the ultrasonic flaw inspection step by a correction coefficient; and a determination step of determining whether a brazing state is good or bad based on the corrected echo value. |
申请公布号 |
JP2013156032(A) |
申请公布日期 |
2013.08.15 |
申请号 |
JP20120014445 |
申请日期 |
2012.01.26 |
申请人 |
TAISEI CORP;MARUWA GIKEN:KK;INSTITUTE OF NATIONAL COLLEGES OF TECHNOLOGY JAPAN |
发明人 |
TAKAKURA KATSUHIKO;MORITA TAIJI;KAYA FUMITAKA;SASAKI MAKOTO;IWAMOTO TATSUYA |
分类号 |
G01N29/04;G01B17/02;G01N29/30 |
主分类号 |
G01N29/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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