发明名称 Method of manufacturing a semiconductor device
摘要 <p>Semiconductor devices including at least one thin film transistor (TFT) and methods of manufacturing the semiconductor devices. The semiconductor device may include an oxide TFT having a self-align top gate structure. The oxide TFT may include a first oxide semiconductor layer having a first source region, a first drain region, and a first channel region between the first source region and the first drain region, and a first gate insulating layer and a first gate electrode, which are sequentially stacked on the first channel region. A bottom gate electrode may be further disposed below the first oxide semiconductor layer, and the first oxide semiconductor layer may have a multi-layer structure.</p>
申请公布号 EP2120267(B1) 申请公布日期 2013.08.07
申请号 EP20090160223 申请日期 2009.05.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, JAE-CHUL;KWON, KEE-WON
分类号 H01L29/786;H01L29/66 主分类号 H01L29/786
代理机构 代理人
主权项
地址
您可能感兴趣的专利