发明名称 SYSTEM FOR MEASURING WAVE SOURCE
摘要 The present invention relates to a system for measuring a wave source and comprises: a plurality of antennas, arranged on fixed axes, which receive spurious waves; an antenna support supporting the antennas and on the surface of which are installed cables connected to each of the antennas; a frequency and phase measuring unit that measures the frequencies of the spurious waves on the basis of a signal received from the antennas through the cables on the antenna support and measures phases among the antennas arranged on each axis, using the measured frequencies; a generating point measuring unit that produces a function value relevant to a distance from the origin of an arranged axis to the points at which the spurious waves are generated, and the angle of the extended line from the origin to the points at which the spurious waves are generated and the arranged axis, on the basis of the relative phase differences among antennas arranged on each axis that is measured by the frequency and phase measuring unit, and produces traces using the produced function value, and determines the intersections of the traces to measure the points at which the spurious waves are generated.
申请公布号 KR101281057(B1) 申请公布日期 2013.07.09
申请号 KR20110094417 申请日期 2011.09.20
申请人 发明人
分类号 G01R29/08;G01S5/20 主分类号 G01R29/08
代理机构 代理人
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