| 摘要 |
PURPOSE: A test apparatus for ejecting noise to the outside using a ground via, which forms a ground pad and a ground line via to prevent degrading the chip property according to power source design and radio frequency property, and minimizes the effect of power source noise, is provided. CONSTITUTION: A test apparatus (100) comprises: a data line (120) which is applied the power source necessary when testing from the outside and provides it to the test apparatus; a capacitor (160) which has one side connected to the data line, and which removes the power noise of the power source provided to the data line; a via for a capacitor connected to the other end of the capacitor; and a ground pad (150) for a capacitor ejecting noise accumulated in the capacitor to the outside.
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