发明名称 |
NITRIDE SEMICONDUCTOR AND FABRICATING METHOD THEREOF |
摘要 |
PURPOSE: A nitride semiconductor device and a manufacturing method thereof are provided to reduce a leakage current through a barrier layer by forming a base area of a heterojunction bipolar transistor to include the barrier layer. CONSTITUTION: A semiconductor layer(301,303,305) includes a plurality of nitride-based electrode junction layers and a plurality of barrier layers. The plurality of nitride-based electrode junction layers have different electrical characteristics. The plurality of barrier layers are separately arranged between the electrode junction layers. A plurality of electrodes(307) are respectively in contact with the plurality of nitride-based electrode junction layers. The plurality of electrodes are separated from each other.
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申请公布号 |
KR20130069158(A) |
申请公布日期 |
2013.06.26 |
申请号 |
KR20110136742 |
申请日期 |
2011.12.16 |
申请人 |
KYUNGPOOK NATIONAL UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION |
发明人 |
LEE, JUNG HEE;KIM, DONG SEOK;IM, KI SIK;KANG, HEE SUNG |
分类号 |
H01L29/737;H01L21/331 |
主分类号 |
H01L29/737 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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