发明名称 NITRIDE SEMICONDUCTOR AND FABRICATING METHOD THEREOF
摘要 PURPOSE: A nitride semiconductor device and a manufacturing method thereof are provided to reduce a leakage current through a barrier layer by forming a base area of a heterojunction bipolar transistor to include the barrier layer. CONSTITUTION: A semiconductor layer(301,303,305) includes a plurality of nitride-based electrode junction layers and a plurality of barrier layers. The plurality of nitride-based electrode junction layers have different electrical characteristics. The plurality of barrier layers are separately arranged between the electrode junction layers. A plurality of electrodes(307) are respectively in contact with the plurality of nitride-based electrode junction layers. The plurality of electrodes are separated from each other.
申请公布号 KR20130069158(A) 申请公布日期 2013.06.26
申请号 KR20110136742 申请日期 2011.12.16
申请人 KYUNGPOOK NATIONAL UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION 发明人 LEE, JUNG HEE;KIM, DONG SEOK;IM, KI SIK;KANG, HEE SUNG
分类号 H01L29/737;H01L21/331 主分类号 H01L29/737
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