发明名称 DIFFERENTIAL CURRENT MEASUREMENTS TO DETERMINE ION CURRENT IN THE PRESENCE OF LEAKAGE CURRENT
摘要 An ion chamber provides a current representative of its characteristics as affected by external conditions, e.g., clean air or smoke. A direct current (DC) voltage is applied to the ion chamber at a first polarity and the resulting current through the ion chamber and parasitic leakage current is measured at the first polarity, then the DC voltage is applied to the ion chamber at a second polarity opposite the first polarity, and the resulting current through the ion chamber and parasitic leakage current is measured at the second polarity. Since substantially no current flows through the ion chamber at the second polarity, the common mode parasitic leakage current contribution may be removed from the total current measurement by subtracting the current measured at the second polarity from the current measured at the first polarity, resulting in just the current through the ion chamber.
申请公布号 WO2013052622(A3) 申请公布日期 2013.06.20
申请号 WO2012US58688 申请日期 2012.10.04
申请人 MICROCHIP TECHNOLOGY INCORPORATED 发明人 JULICHER, JOSEPH;CURTIS, KEITH;KATZ, PAUL, N.
分类号 G01N27/66;G08B17/11 主分类号 G01N27/66
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