发明名称 SAMPLE STAGE AND CHARGED PARTICLE DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a fine vibration removing mechanism for actualizing a sample stage capable of improving image quality of an observation image suppressing fine vibrations of a top table. <P>SOLUTION: The fine vibration removing mechanism includes a movable part mounted on the top table, a fixed part mounted on an intermediate table, an elastic support part for elastically supporting the movable part for the fixed part, and piezoelectric actuators which drive the movable part for the fixed part. The elastic support part is arranged connecting four corners of the fixed part and four corners of the movable part to each other, and the piezoelectric actuators are arranged on both X-axial sides of the fixed part along the same straight line, and include a pair of X-axial piezoelectric actuators extending and contracting in mutually opposite directions and a pair of Y-axial piezoelectric actuators arranged on both Y-axial sides of the fixed part along the same straight line, and extending and contracting in mutually opposite directions. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013118170(A) 申请公布日期 2013.06.13
申请号 JP20120177692 申请日期 2012.08.10
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 TAKAHASHI MUNEHIRO;ODAI MASAKI;OGAWA HIRONORI;KITSUNAI HIROYUKI;TSUJI HIROSHI;NAKAGAWA SHUICHI;MIZUOCHI MAKI
分类号 H01J37/20 主分类号 H01J37/20
代理机构 代理人
主权项
地址