发明名称 NONVOLATILE STORAGE ELEMENT, NONVOLATILE STORAGE DEVICE, NONVOLATILE SEMICONDUCTOR DEVICE AND NONVOLATILE STORAGE ELEMENT MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a nonvolatile storage element capable of achieving a high-speed operation, which has reversible and stable rewriting characteristics, excellent retention characteristics, and a high affinity for a semiconductor manufacturing process; and provide a manufacturing method of the nonvolatile storage element, a nonvolatile storage device equipped with the nonvolatile storage element and a nonvolatile semiconductor device. <P>SOLUTION: A nonvolatile storage element of an embodiment comprises: a first electrode 103; a second electrode 105; and a resistance change layer 104 arranged between the first electrode 103 and the second electrode 105 and having a resistance value reversibly changing based on an electric signal applied to between both electrodes 103, 105. The resistance change layer 104 includes at least a tantalum oxide and is formed so as to satisfy 0<x<2.5 when assuming that the tantalum oxide is represented as TaO<SB POS="POST">x</SB>. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013102181(A) 申请公布日期 2013.05.23
申请号 JP20120288753 申请日期 2012.12.28
申请人 PANASONIC CORP 发明人 FUJII SATORU;TAKAGI TAKESHI;SHIMAKAWA KAZUHIKO;MURAOKA SHUNSAKU;OSANO KOICHI
分类号 H01L27/105;H01L45/00;H01L49/00 主分类号 H01L27/105
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