发明名称 MONITORING APPARATUS AND METHOD THEREOF
摘要 PURPOSE: A monitoring device and a monitoring method are provided to extend the service time of an expensive wafer transfer robot and to improve productivity. CONSTITUTION: A monitoring device comprises a sensor unit(210), a control unit(230), a display unit(240), and a communication unit. The sensor unit is attached to a wafer transfer robot and measures sound signals generated when the robot is moved. The control unit sorts a band of signals generated by the movement of the robot among the measured sound signals, removes noise signals included in the sorted sound signals, and confirms whether the malfunction of components of the robot corresponding to a position where the sound signals are measured is existed or not. The display unit displays a result of the confirmation. [Reference numerals] (210) Sensor unit; (220) Storage unit; (230) Control unit; (240) Display unit; (250) Voice output unit
申请公布号 KR101265540(B1) 申请公布日期 2013.05.20
申请号 KR20130002360 申请日期 2013.01.09
申请人 SUNNIX. CO., LTD. 发明人 KIM, JAE MIN;KIM, JAE HYUN;LEE, JUNG HO;LEE, SANG SHIN;PARK, KYU SUNG
分类号 G01N29/14;G01N29/44 主分类号 G01N29/14
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