发明名称 PATTERN FORMING METHOD AND RESIST COMPOSITION
摘要 <P>PROBLEM TO BE SOLVED: To provide a pattern forming method capable of forming a resist composition for forming a negative pattern, which provides a high dissolution contrast with high sensitivity in a development using an organic solvent, and to provide a hole pattern by means of positive/negative reversal by developing using an organic solvent. <P>SOLUTION: The pattern forming method for obtaining negative pattern with an undissolved exposed portion comprises the steps of: applying a polymeric compound having vinyl alcohol replaced with an acid-labile group and maleic anhydride and/or maleimide as a repeating unit, an acid generator and a resist composition including organic solvent over a substrate; exposing the resist film with high-energy rays after heat processing; and dissolving an unexposed portion using a developer of organic solvent after heat processing. A photoresist film, which includes the polymeric compound having the vinyl alcohol replaced with the acid-labile group and the maleic anhydride and/or maleimide as a repeating unit and the acid generator, has the characteristics of high dissolving contrast in which the unexposed part has a quick solubility and the exposed portion has a slow solubility in forming positive/negative reverse image developed using organic solvent developer. By exposing using the photoresist film to perform organic solvent development, a minute hole pattern can be formed under a satisfactory dimensional control with a high sensitivity. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013076990(A) 申请公布日期 2013.04.25
申请号 JP20120194757 申请日期 2012.09.05
申请人 SHIN ETSU CHEM CO LTD 发明人 HATAKEYAMA JUN;KATAYAMA KAZUHIRO;HASEGAWA KOJI
分类号 G03F7/038;G03F7/004;G03F7/039;G03F7/32;H01L21/027 主分类号 G03F7/038
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