| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method and a device of finding abnormality, especially poor soldering, of a solar cell before laminating a cell in the production process of solar cell, in units smaller than the cell. <P>SOLUTION: In order to evaluate an evaluation region defined by dividing a cell, the dose of light for exposing a cell including the evaluation region is set lower than that of other cells, and the characteristic values of a solar cell are measured by changing the dose of light for exposing the evaluation region. Evaluation is performed based on the change of characteristic values. When evaluation is performed while changing the evaluation region, a determination can be made that a part of different evaluation result is abnormal. When performing the evaluation after soldering and before laminating the cell, poor soldering can be found and repaired easily. <P>COPYRIGHT: (C)2013,JPO&INPIT |
