发明名称 SOCKET AND ELECTRONIC COMPONENT TESTING APPARATUS
摘要 <p>PURPOSE: A socket and electronic component test apparatus are provided to suppress the generation of poor contacts between an electrode and an inner terminal by pushing and smoothing out wrinkles on a contact sheet film to suppress poor contacts which can be generated by the wrinkles. CONSTITUTION: A socket(11) is equipped with a contactor(125) contacting with an external terminal(312), and an elastic component(131), and the elastic component has a first elastic layer(132) and a second elastic layer(133). A pressing device(13) is equipped with the elastic component touching the bottom surface of a base film(32), a plate-shaped supporting component(137) supporting the rubber component, and a coil spring(138).</p>
申请公布号 KR20130036707(A) 申请公布日期 2013.04.12
申请号 KR20120106870 申请日期 2012.09.26
申请人 ADVANTEST CORP. 发明人 NAKAMURA KIYOTO;FUJISAKI TAKASHI
分类号 G01R31/02 主分类号 G01R31/02
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