AN APPARATUS FOR PREDICTING CHANGE OF TUNDISH REFRACTORY AND A METHOD FOR PREDICTING CHANGE OF TUNDISH REFRACTORY

摘要

PURPOSE: An apparatus for predicting the thickness variation of a tundish refractory and a method thereof are provided to predict the replacement time of the refractory as the thickness variation of the refractory is predicted by measuring the outer surface temperature of a tundish. CONSTITUTION: An apparatus for predicting the thickness variation of a tundish refractory comprises a burner part(110), a temperature measuring part(120), and a control part(130). The temperature measuring part measures the outer surface temperature of a tundish. The control part stores and manages the measured surface temperature value. The control part calculates the deviation between a set surface temperature value and the measured surface temperature value of the tundish to predict the thickness of the refractory.