| 摘要 |
<P>PROBLEM TO BE SOLVED: To individually inspect whether or not a positive polarity side pixel circuit part and a negative polarity side pixel circuit part in each pixel are normally operated, and to shorten an inspection time of the pixel. <P>SOLUTION: A Tr1 and a Tr2 are put in an ON state, and a positive polarity inspection signal and a negative polarity inspection signal are written in storage capacitors Cs1, Cs2 via data lines Di+, Di-, respectively. Subsequently, in the state that an inspection transistor Tr9 is turned on by applying an inspection control signal to a wiring TG for the inspection control signal, a positive polarity side pixel circuit part including source follower buffers (Tr3, Tr7) and a transistor Tr5 and a negative polarity side pixel circuit part including source follower buffers (Tr4, Tr8) and a transistor Tr6 are sequentially and actively controlled, and the positive polarity inspection signal written in the storage capacitor Cs1 and the negative polarity inspection signal written in the storage capacitor Cs2 are sequentially read out to the data line Di+ via the positive polarity side pixel circuit part or the negative polarity side pixel circuit part and the inspection transistor Tr9. <P>COPYRIGHT: (C)2013,JPO&INPIT |
