PROCÉDÉ ET DISPOSITIF POUR LE TEST AUTOMATIQUE EMBARQUE D'UN CIRCUIT INTÉGRÉ,申请号FR20100003024-传众专利搜索

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发明名称	PROCÉDÉ ET DISPOSITIF POUR LE TEST AUTOMATIQUE EMBARQUE D'UN CIRCUIT INTÉGRÉ
摘要
申请公布号	FR2962809(B1)	申请公布日期	2013.03.15
申请号	FR20100003024	申请日期	2010.07.19
申请人	THALES	发明人	EMERIAU SIMON;HELIAS JEROME
分类号	G01R31/3183;G01R31/3193	主分类号	G01R31/3183
代理机构		代理人
主权项
地址

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