| 摘要 |
A defect detecting system and method thereof are disclosed. Wherein, the defect detecting system comprises: a laser device (10) for generating a pulse laser; an optical path adjusting device (20) for adjusting the optical path of the pulse laser generated by the laser device (10) and then projecting the pulse laser on a workpiece's surface to be detected to conduct a pulse laser scanning; a signal receiving device (30) for capturing a thermal excitation ultrasonic wave signal caused by the pulse laser scanning the workpiece; an imaging device (40) for generating a dynamic waveform image based on the thermal excitation ultrasonic wave signal received by the signal receiving device (30).
|
