发明名称 POLISHING LIQUID FOR CMP AND POLISHING METHOD USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a polishing liquid for CMP, which is capable of achieving both high uniformity and a high polishing speed in chemical mechanical polishing (CMP) of a silicon oxide film, and to provide a polishing method using the same. <P>SOLUTION: The polishing liquid for CMP contains abrasive grains, a first additive, a second additive, and water. An organic compound satisfying predetermined conditions is blended as the first additive, and a saturated monocarboxylic acid is blended as the second additive. The method for polishing a substrate having a silicon oxide film on a surface thereof comprises a step of polishing the silicon oxide film by a polishing pad while supplying the polishing liquid for CMP between the silicon oxide film and the polishing pad. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013038211(A) 申请公布日期 2013.02.21
申请号 JP20110172867 申请日期 2011.08.08
申请人 HITACHI CHEM CO LTD 发明人 YOSHIKAWA SHIGERU;OTA MUNEHIRO;TANAKA TAKAAKI
分类号 H01L21/304;B24B37/00;C09K3/14 主分类号 H01L21/304
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