Statistical evaluation of circuit robustness separating local and global variation

摘要

Semiconductor fabrication using statistical analysis (400) to determine the robustness or reliability of a fabricated integrated circuit module given global and local variations of operating parameters of elements, such as transistors, of the module. Multiple sequences of statistical simulations (408, 414) are run to ascertain (416) the robustness of the module to local variations in an environment of global variations.