发明名称 RECIPE GENERATING DEVICE, INSPECTION ASSISTING DEVICE, INSPECTION SYSTEM, AND RECORDING MEDIUM
摘要 <P>PROBLEM TO BE SOLVED: To analyze information recorded in a design layout directly, extract a desired area, and use the extraction method to generate an inspection recipe and to accomplish inspection in an efficient manner. <P>SOLUTION: Hierarchical information in design layout data is analyzed. The frequency of reference within the design layout data is calculated for each of cells that constitute internal data. The cells are rearranged in order of greatest frequency of reference. A target is searched. A high-ranking cell thereof is tracked. Thereby, area extraction of a desired circuit module, such as a memory mat, is facilitated. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013033875(A) 申请公布日期 2013.02.14
申请号 JP20110169736 申请日期 2011.08.03
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 NAKAGAKI AKIRA;HAMAMURA YUICHI;ENOMOTO YUJI;TANSHIRO YU;SAKAI TSUNEHIRO;HASUMI KAZUHISA
分类号 H01L21/66 主分类号 H01L21/66
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